4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Timothy E. Neary

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Feedback method to repair phase shift masks

Image analysis – Applications – Manufacturing or product inspection
Patent

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Inspection method for protecting image sensor devices with...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method for repair of photomasks

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Patent

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Method for repairing photomasks

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Patent

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Method of thinning a semiconductor substrate

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Subsequent separation into plural bodies
Reexamination Certificate

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Profile ID: LFUS-PAI-P-797422

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