4. Brushing, scrubbing, and general cleaning

Tetsuya Akashi

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Charged particle beam equipment

Radiant energy – Inspection of solids or liquids by charged particles
Reexamination Certificate

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Electron interferometer or electron microscope

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Reexamination Certificate

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Interferometer

Optics: measuring and testing – By light interference
Reexamination Certificate

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Method for securing screw means onto metal plate and metal plate

Brushing – scrubbing – and general cleaning
Patent

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Profile ID: LFUS-PAI-P-1851488

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