4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Tetsuo Hoki

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Method of and apparatus for detecting pattern defects

Image analysis – Histogram processing – For setting a threshold
Patent

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Method of and apparatus for detecting pattern defects by means o

Image analysis – Histogram processing – For setting a threshold
Patent

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Method of and apparatus for inspecting conductive pattern on pri

Image analysis – Histogram processing – For setting a threshold
Patent

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Method of and apparatus for inspecting conductive pattern on pri

Image analysis – Histogram processing – For setting a threshold
Patent

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Method of and apparatus for inspecting conductive pattern on pri

Image analysis – Histogram processing – For setting a threshold
Patent

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Profile ID: LFUS-PAI-P-161124

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