4. Radiant energy
  5. Photocells; circuits and apparatus
  6. Optical or pre-photocell system

Takeshi Wakita

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Apparatus and method for inspecting film defect

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Disk surface inspection method and apparatus therefor

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Patent

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Profile ID: LFUS-PAI-P-671539

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