4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Combined with electrical contact or lead
  6. Of specified material other than unalloyed aluminum

Takeo Ushiki

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Film thickness measuring apparatus and a method for...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Film thickness measuring apparatus and a method for...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Method and apparatus for measuring thickness of thin film

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Production managing system of semiconductor device

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Production managing system of semiconductor device

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2036725

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