4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Svetlana V. Nikitina

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Detecting unit for X-ray diffraction measurements

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Fluorescent sensor on basis of multichannel structures

Optics: measuring and testing – Sample – specimen – or standard holder or support – Fluid containers
Reexamination Certificate

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Method for determination of elastic strains present in...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2997905

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