4. Semiconductor device manufacturing: process
  5. Gettering of substrate
  6. By layers which are coated, contacted, or diffused

Sundar S. Chetlur

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Automated system for estimating ring oscillator reliability...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Deuterium passivated semiconductor device having enhanced...

Active solid-state devices (e.g. – transistors – solid-state diode – With specified dopant
Reexamination Certificate

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Method of determining a trap density of a...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Method of forming semiconductor device with LDD structure

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Method of using getter layer to improve metal to metal contact r

Semiconductor device manufacturing: process – Gettering of substrate – By layers which are coated – contacted – or diffused
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Profile ID: LFUS-PAI-P-1321428

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