4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Field effect device
  6. Having insulated electrode

Sidense Corp.

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Program lock circuit for a mask programmable anti-fuse...

Static information storage and retrieval – Read only systems – Fusible
Reexamination Certificate

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Program verify method for OTP memories

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Split-channel antifuse array architecture

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Test circuit for an unprogrammed OTP memory array

Static information storage and retrieval – Read/write circuit – Testing
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