Image analysis
Applications
Manufacturing or product inspection
Inventor
active
Alternating phase-shift mask inspection method and apparatus
Local bias map using line width measurements
Local bias map using line width measurements
No associations
LandOfFree
Shirley Hemar does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Shirley Hemar, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Shirley Hemar will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-2903744