4. Optics: measuring and testing
  5. Refraction testing

Shinichiro Saisho

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Apparatus and method forming thin film

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering
Reexamination Certificate

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Method of measuring refractive index of thin film and refractive

Optics: measuring and testing – Refraction testing
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Profile ID: LFUS-PAI-P-1629103

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