4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Shigeru Takemoto

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Apparatus and method for inspecting predetermined region on...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Apparatus for binarizing images

Facsimile and static presentation processing – Facsimile – Specific signal processing circuitry
Patent

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Interferometer, adjusting method therefor, stage apparatus havin

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Mask inspecting apparatus

Image analysis – Histogram processing – For setting a threshold
Patent

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Profile ID: LFUS-PAI-P-357760

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