4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Signal converting, shaping, or generating
  6. Clock or pulse waveform generating

Shigekazu Otsuka

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Semiconductor device including macros and its testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit and method for generating a...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Clock or pulse waveform generating
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2527578

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