4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Seung-whan Seo

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Parallel bit test apparatus and parallel bit test method...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor memory device including post package repair...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2242085

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