4. Optics: measuring and testing
  5. By dispersed light spectroscopy
  6. Utilizing a spectrometer

Seizi Nishizawa

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Apparatus for and method of evaluating multilayer thin film

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Infrared light emitting device, infrared light detecting...

Radiant energy – Invisible radiant energy responsive electric signalling – Infrared responsive
Reexamination Certificate

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Michelson interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Optical apparatus components having spectrally overlapping chara

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Profile ID: LFUS-PAI-P-395125

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