4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Chemical analysis

Scott Alan Estes

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Copper contamination detection method and system for...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Reexamination Certificate

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Slurry for mechanical polishing (CMP) of metals and use thereof

Cleaning compositions for solid surfaces – auxiliary compositions – Cleaning compositions or processes of preparing – For cleaning a specific substrate or removing a specific...
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2251682

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