4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Schwegman, Lundberg, Woessner & Kluth, P. A.

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Electronic assemblies with solidified thixotropic thermal...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With provision for cooling the housing or its contents
Reexamination Certificate

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Memory address and decode circuits with ultra thin body...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Method and system for dynamic duration burn-in

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Soft programming for recovery of overerasure

Electrical computers and digital data processing systems: input/ – Intrasystem connection – System configuring
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Profile ID: LFUS-PAI-P-2074752

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