4. Measuring and testing
  5. Speed, velocity, or acceleration
  6. Acceleration determination utilizing inertial element

Sarah Zerbini

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Fabrication process for microstructure protection systems...

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates
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High sensitivity microelectromechanical sensor with rotary...

Measuring and testing – Speed – velocity – or acceleration – Angular rate using gyroscopic or coriolis effect
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Integrated gyroscope of semiconductor material

Measuring and testing – Speed – velocity – or acceleration – Angular rate using gyroscopic or coriolis effect
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Integrated gyroscope of semiconductor material with at least...

Measuring and testing – Speed – velocity – or acceleration – Angular rate using gyroscopic or coriolis effect
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Method for assembling an actuator device for a hard disk,...

Dynamic magnetic information storage or retrieval – Head mounting – Disk record
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Profile ID: LFUS-PAI-P-2427497

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