4. Static information storage and retrieval
  5. Addressing
  6. Sync/clocking

Sang-jib Han

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Integrated circuit capable of being burn-in tested using an...

Static information storage and retrieval – Addressing – Sync/clocking
Reexamination Certificate

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Integrated circuit capable of being burn-in tested using an...

Static information storage and retrieval – Powering
Reexamination Certificate

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Semiconductor multi-chip package including two semiconductor...

Static information storage and retrieval – Format or disposition of elements
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2537972

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