4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Sang-Bae An

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Device power supply extension circuit, test system including...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Semiconductor test system and method for effectively testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2958403

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