4. Image analysis
  5. Learning systems
  6. Trainable classifiers or pattern recognizers

Saibal Banerjee

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Methods, defect review tools, and systems for locating a...

Image analysis – Applications – Manufacturing or product inspection
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Power assisted automatic supervised classifier creation tool...

Image analysis – Learning systems – Trainable classifiers or pattern recognizers
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Transit devices and system including a slow protocol filter...

Multiplex communications – Pathfinding or routing – Switching a message which includes an address header
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Profile ID: LFUS-PAI-P-3015407

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