4. Communications: electrical
  5. Continuously variable indicating
  6. With meter reading

Roy R. Shanks

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Controlled selective disconnect system for wafer scale integrate

Communications: electrical – Continuously variable indicating – With meter reading
Patent

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Test wafer for diagnosing flaws in an integrated circuit fabrica

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Thin film memory device employing amorphous semiconductor materi

Static information storage and retrieval – Magnetic bubbles – Guide structure
Patent

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Profile ID: LFUS-PAI-P-970645

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