Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
Inventor
active
CA resistance variability prediction methodology
Electroplated CoWP composite structures as copper barrier...
Electroplated CoWP composite structures as copper barrier...
No associations
LandOfFree
Roger Y. Tsai does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Roger Y. Tsai, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Roger Y. Tsai will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-3032256