Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
Inventor
active
Backside contamination inspection device
Backside contamination inspection device
Backside contamination inspection device
Edge handling wafer chuck
No associations
LandOfFree
Rodney G Smedt does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Rodney G Smedt, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Rodney G Smedt will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-2027706