4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Robert S. Harp

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Coax-to-radial transition

Amplifiers – Signal feedback – Combined with control of bias voltage of signal amplifier
Patent

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Conical power combiner

Oscillators – Plural oscillators – Parallel connected
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Detecting system for scanning microscopes

Measuring and testing – Surface and cutting edge testing – Roughness
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Detection system for atomic force microscopes

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Detection system for atomic force microscopes

Measuring and testing – Surface and cutting edge testing – Roughness
Reissue Patent

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Profile ID: LFUS-PAI-P-480515

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