4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Richard Burch

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Extraction method of defect density and size distributions

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Method and system for failure signal detection analysis

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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Profile ID: LFUS-PAI-P-2956497

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