4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Heterojunction device
  6. Field effect transistor

Renichi Yamada

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Dynamic random access memories and method for testing...

Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate

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Semiconductor device and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3053997

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