4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Randall Rooney

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Memory employing multiple enable/disable modes for redundant...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Memory employing multiple enable/disable modes for redundant...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Pseudo fail bit map generation for RAMS during component...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2537580

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