4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Ra-Min Tain

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Apparatus and method for measuring diode chip

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip package structure and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Insulating material
Reexamination Certificate

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Flexible circuit board with heat sink

Electricity: electrical systems and devices – Housing or mounting assemblies with diverse electrical... – For electronic systems and devices
Reexamination Certificate

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LED lamp

Illumination – Light source and modifier – With ventilating – cooling or heat insulating means
Reexamination Certificate

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LED lamp

Illumination – Light source and modifier – With ventilating – cooling or heat insulating means
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2288085

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