4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

Phillip J. Restle

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Alpha particle shield for integrated circuit

Active solid-state devices (e.g. – transistors – solid-state diode – With shielding
Reexamination Certificate

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Built in self test circuit for measuring total timing...

Horology: time measuring systems or devices – Time interval – Electrical or electromechanical
Reexamination Certificate

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Built in self test circuit for measuring total timing...

Horology: time measuring systems or devices – Time interval – Electrical or electromechanical
Reexamination Certificate

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Capacitive bend sensor

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent

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Clock gated power supply noise compensation

Miscellaneous active electrical nonlinear devices – circuits – and – Specific signal discriminating without subsequent control – By amplitude
Reexamination Certificate

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Profile ID: LFUS-PAI-P-673659

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