4. X-ray or gamma ray systems or devices
  5. Electronic circuit
  6. With display or signaling

Peter J. Fiekowsky

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Fast image simulation for photolithography

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Fast image simulation for photolithography

Photocopying – Projection printing and copying cameras – Methods
Reexamination Certificate

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Flat panel display inspection system

Computer graphics processing and selective visual display system – Plural physical display element control system – Display elements arranged in matrix
Patent

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High accuracy particle dimension measurement system

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
Patent

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High accuracy particle dimension measurement system

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement
Reexamination Certificate

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Profile ID: LFUS-PAI-P-831118

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