4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Peleg Lior

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Testability architecture for modularized integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testability method for modularized integrated circuits

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Profile ID: LFUS-PAI-P-1212600

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