4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Paul Harris Hasten

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Inspection system and method for leads of semiconductor devices

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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System and method for conditioning leads

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-187387

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