4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Patrick T. Beyer

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Low-temperature semiconductor device testing apparatus with...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method for testing damaged integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Multi-chambered container and two-piece adapter

Bottles and jars – Compartment
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2686215

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