4. Measuring and testing
  5. Testing by impact or shock
  6. Accelerated or decelerated specimen

Patrick M. Miller

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Etching processes for avoiding edge stress in semiconductor chip

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step
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Sled docking system

Measuring and testing – Testing by impact or shock – Accelerated or decelerated specimen
Patent

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Sled testing system

Measuring and testing – Testing by impact or shock – Accelerated or decelerated specimen
Patent

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