4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Norio Fujii

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Apparatus for detecting defects in pattern

Image analysis – Histogram processing – For setting a threshold
Patent

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Apparatus for detecting the defect of pattern

Facsimile and static presentation processing – Facsimile – Specific signal processing circuitry
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Apparatus for detecting two-dimensional pattern and method for t

Image analysis – Histogram processing – For setting a threshold
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Aqueous coal slurry composition

Fuel and related compositions – Liquid fuels – Aluminum or heavy metal – other than lead – containing
Patent

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Automatic focusing device of a microscope

Radiant energy – Photocells; circuits and apparatus – Photocell controls its own optical systems
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Profile ID: LFUS-PAI-P-214289

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