4. Radiant energy
  5. Inspection of solids or liquids by charged particles
  6. Methods

Nongjian Tao

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Apparatus and method for fabricating arrays of atomic-scale...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Apparatus and method for fabricating arrays of atomic-scale...

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal
Reexamination Certificate

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Method of electrochemical detection/identification of single org

Radiant energy – Inspection of solids or liquids by charged particles – Methods
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Surface plasmon resonance detection with high angular...

Optics: measuring and testing – Of light reflection
Reexamination Certificate

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System and method for measuring conductivity on molecular level

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Profile ID: LFUS-PAI-P-1450045

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