4. Electricity: measuring and testing
  5. Magnetic
  6. Magnetometers

Nobuhiro Shimizu

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Apparatus for detecting a fine magnetic field with a signal adju

Electricity: measuring and testing – Magnetic – Magnetometers
Patent

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Cantilever probe and scanning type probe microscope utilizing th

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Cantilever unit and scanning probe microscope utilizing the...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Correlation sample for scanning probe microscope and method...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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DC superconducting quantum interference device with shield layer

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Tunneling through region of reduced conductivity
Patent

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Profile ID: LFUS-PAI-P-436423

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