4. Ordnance
  5. Mounts
  6. Training mechanisms

Moshe Langer

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High resolution wafer inspection system

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Method and system for aiming a small caliber weapon

Ordnance – Mounts – Training mechanisms
Patent

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Profile ID: LFUS-PAI-P-1776542

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