4. Thermal measuring and testing
  5. Differential thermal analysis

Ming-Jhy Jiang

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Memory card

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – In combination with or also constituting light responsive...
Reexamination Certificate

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Memory card structure

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Smart card package
Reexamination Certificate

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Memory card structure and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Multiple housings
Reexamination Certificate

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Method and apparatus for determining Curie temperatures of ferro

Thermal measuring and testing – Differential thermal analysis
Patent

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Profile ID: LFUS-PAI-P-1337136

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