4. Semiconductor device manufacturing: process
  5. Coating with electrically or thermally conductive material
  6. To form ohmic contact to semiconductive material

Min Sik Kim

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Method and apparatus for measuring resource information of...

Optics: measuring and testing – Angle measuring or angular axial alignment – Photodetection of inclination from level or vertical
Reexamination Certificate

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Room temperature-operating single-electron device and the...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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