4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system

Michelle Larson

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Method and system for updating noise estimates during pauses in

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent

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Process monitor test chip and methodology

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Profile ID: LFUS-PAI-P-820912

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