4. Radiant energy
  5. Inspection of solids or liquids by charged particles
  6. Methods

Michael Phaneuf

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Apparatus and method for reducing differential sputter rates

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering
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Automated method of circuit analysis

Radiant energy – Inspection of solids or liquids by charged particles – Methods
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Automatic focused ion beam imaging system and method

Image analysis – Applications – Manufacturing or product inspection
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Design analysis workstation for analyzing integrated circuits

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Profile ID: LFUS-PAI-P-2057685

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