4. Measuring and testing
  5. Surface and cutting edge testing

Max-Gerhard Seitz

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active

Electronic component including a housing and a substrate

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With contact or lead
Reexamination Certificate

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Method and arrangement for determining tool wear

Measuring and testing – Surface and cutting edge testing
Patent

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Profile ID: LFUS-PAI-P-1790118

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