4. Electrical connectors
  5. Including elastomeric or nonmetallic conductive portion
  6. Adapted to be sandwiched between preformed panel circuit...

Maurice Heathcote Norcott

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Control of buried oxide in SIMOX

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Total dielectric isolation
Reexamination Certificate

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Control of buried oxide in SIMOX

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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High density cantilevered probe for electronic devices

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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High density cantilevered probe for electronic devices

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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High density cantilevered probe for electronic devices

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-47452

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