4. Data processing: database and file management or data structures
  5. Database and file access
  6. Record, file, and data search and comparisons

Matthew Marcus

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Apparatus for inspection of semiconductor wafers and masks...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Optimizations of XPaths

Data processing: database and file management or data structures – Database and file access – Record – file – and data search and comparisons
Reexamination Certificate

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Photoelectron emission microscope for wafer and reticle...

Radiant energy – Inspection of solids or liquids by charged particles – Methods
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2228300

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