4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Masayuki Yoshiyama

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Semiconductor device having scan test circuit that switches...

Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch
Reexamination Certificate

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Semiconductor integrated circuit including test facilitation...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2047705

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