4. Image analysis
  5. Pattern recognition
  6. Template matching

Masaya Nakao

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Alignment detection apparatus

Image analysis – Applications – Manufacturing or product inspection
Patent

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Appearance inspecting method

Image analysis – Histogram processing – For setting a threshold
Patent

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Computer implemented method of recognizing a position of an obje

Image analysis – Image transformation or preprocessing – Selecting a portion of an image
Patent

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Method for position recognition

Image analysis – Histogram processing – With a gray-level transformation
Patent

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Method for shape detection using density correlation valves

Image analysis – Pattern recognition – Template matching
Patent

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Profile ID: LFUS-PAI-P-299503

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