4. X-ray or gamma ray systems or devices
  5. Source

Masahiro Tooma

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Laser plasma x-ray source, semiconductor lithography apparatus u

X-ray or gamma ray systems or devices – Source
Patent

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Ultrasonic array sensor, ultrasonic inspection instrument...

Measuring and testing – Vibration – By mechanical waves
Reexamination Certificate

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Ultrasonic flaw detecting method and ultrasonic flaw detector

Measuring and testing – Vibration – By mechanical waves
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1328368

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