4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Mark Joseph Wihl

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Automated photomask inspection apparatus

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Automated photomask inspection apparatus

Image analysis – Applications – Manufacturing or product inspection
Patent

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Automated photomask inspection apparatus

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Efficient phase defect detection system and method

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1966026

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