4. Special receptacle or package
  5. Holder for a removable electrical component
  6. For a semiconductor wafer

Manabu Hayashida

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Method and apparatus for substrate defect testing by surface...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Substrate cassette

Special receptacle or package – Holder for a removable electrical component – For a semiconductor wafer
Patent

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Test probe device for a display panel and test probe positioning

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Profile ID: LFUS-PAI-P-1418073

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